Surface roughness influences many mechanical properties, including friction and adhesion, surface reactivity, semiconductor substrate quality, and surface interaction with electromagnetic waves, ...

To map the topography of surface features, an atomic-force microscope (AFM) uses physical contact between a fine mechanical probe tip and a sample. This microscopy technique can reveal small defects ...

Sponsored by Park SystemsReviewed by Olivia FrostJun 13 2025 With the advancement of nanotechnology, understanding surface properties at the nano- and sub-nanoscale has become increasingly important.

In integrated circuit manufacturing, chemical mechanical polishing (CMP) is used to control the surface roughness of wafers and other substrates—a key factor influencing the reliability of final ...

InSight 300 is a fabrication-ready, automated atomic force microscope (AAFM) engineered for dependable and economical inline metrology in high-volume semiconductor production settings. Boasting a ...