One of the common modes of scanning probe microscopy (SPM) is Magnetic force microscopy (MFM). As indicated by the name, SPM is used to map magnetic properties. On the nanoscale, MFM probes local ...
In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...
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