TOKYO, Dec. 07, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced three new additions to its suite of memory test products. The ...
The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
T5773 and HA5100CELL are new solutions that accommodate high-capacity, high-speed, next-generation NAND flash memory devices from wafer test to volume production. The T5773 Test System provides ...
TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and ...
NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, Inc. (TER) (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the Magnum 7H, a ...
Leveraging fast, powerful parallel test capabilities, the T5377 tests up to 256 memory devices simultaneously at speeds of 143 MHz or 286 MHz for double-data-rate memories. What's more, the system is ...
Credence Systems Corp. today seemed unfazed by the downturn in the automatic test equipment (ATE) sector of the chip industry, announcing an expansion to its memory products division. Credence's ...
Teradyne Inc., a maker of electronic test equipment based in North Reading, reports it has agreed to spend $325 million to purchase San Jose-based Nextest Systems Corp. The acquisition would provide ...
Octal flash memory, or octal data transfer interface, utilizes eight data lines for input and output operations, resulting in significantly higher data transfer rates compared to serial, dual, and ...
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