Occupying a footprint of just 420×297 mm, the MM-200 measuring microscope from Nikon Instruments is 50% smaller than existing Nikon MM models and weighs only 40 kg. The scope, which can be used for ...
SAN FRANCISCO — Japan's Nikon Corp. took the Semicon West trade show here to announce an integrated inspection and measurement technology for use in its line of scanners. The product, called the ...
CD-SEM, or critical-dimension scanning electron microscope, is a tool for measuring feature dimensions on a photomask. A scanning electron microscope, or SEM, takes measurements by sending out an ...
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