Atomic force microscopy (AFM) is an advanced microscopy technique that enables researchers to characterize the surface features of nanoparticles as small as 6 nm across. Image Credit: sanjaya viraj ...

In the lab Researchers at TU Wien employed noncontact atomic force microscopy and computational modelling to determine the structure of the aluminium oxide surface. (Courtesy: TU Wien) Determining the ...

Oscar Custance is a scientist specialized in atomic resolution dynamic force microscopy (DFM) operated using the frequency modulation detection method –a technique also known as non-contact atomic ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...