STAr Technologies, a leading semiconductor test probe card manufacturer, is pleased to announce that its trademark application for "PoWoS," Probe-on-Wafer-on-Substrate, has been approved by Taiwan ...
LIVERMORE, Calif. — FormFactor Inc. rolled out a large-area array probe card that supports 253 devices under test (DUTs) “per touchdown” for DRAMs. Utilizing FormFactor's PH100 large-area and ...
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