It is well documented that rising die junction temperature creates a number of reliability and performance issues for power semiconductors. As an example, a Freescale White Paper on thermal management ...
STAr Technologies, a leader in semiconductor reliability test systems and probe cards, today announced the acquisition of Accel-RF Instruments Corporation located in San Diego, California, USA. This ...
Frank Heidemann, VP & Technology Leader, SET, NI and Ritu Favre, Executive Vice President and General Business Manager, Global Business Units, NI © SET / NI After ...
STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...
“In the world of designing cars, planes, AI factories … you’ve got to be perfect,” said Nvidia CEO Jensen Huang on CNBC last month. “And the reason for this is because there is so much at stake.” Cars ...
As the semiconductor industry continues its relentless march towards smaller process nodes and more complex integrated circuits (ICs), the challenge of ensuring reliability has become increasingly ...
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