In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...

A complete test plan includes testing the logic and all memories. That is, until the boss adds, “Oh, by the way, the DFT guy left the company, so you also get to do the test stuff. Choose any tools ...

The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test ...

Our October print edition includes a feature article on modular systems for IC test, and our July issue included a special report on bench and modular instruments for semiconductor test applications.

PXI, PXIe, and AXIe—from per-pin parametric measurement units (PMUs) to RF/microwave instruments—are making inroads in the semiconductor test space as vendors introduce modules suitable for IC test.

IC test solutions providers including Chunghwa Precision Test Tech (CHPT), MPI and WinWay Technology have seen a strong influx of probe card and final-test socket orders for HPC processors, which will ...

Research on 3D stacked IC (3D-SIC) technology has advanced to the point where most semiconductor companies have released or announced 3D-SIC products. These packages require multiple chip dies to be ...