Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

New simulator and computational tools generate realistic ‘virtual tissues’ and map cell-to-cell ‘conversations’ from spatial transcriptomics data, potentially accelerating AI-driven discoveries in ...

TOKYO, Dec. 09, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test ...

MultiKano is the first automatic cell type annotation method tailored to single-cell multi-omics data. MultiKano introduces a novel data augmentation strategy based on paired scRNA-seq and scATAC-seq ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.