New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale imaging and fabrication, enabling both high-resolution surface characterisation and precise nanomachining. By ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Bio-AFM is a cutting-edge technique rooted in the rich history of atomic force microscopy. Here, we discuss its applications to nanoscience. Studying nanoscale biological specimens has been important ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

Schematic diagrams illustrating the atomic arrangement of an MoS₂ specimen observed using 4D-STEM, showing atomic-scale mapping in real-space coordinates x and y and corresponding diffraction patterns ...